taxonID	type	format	identifier	references	title	description	created	creator	contributor	publisher	audience	source	license	rightsHolder	datasetID
03A7E02F0609FFEBFD58FD092C57401A.taxon	http://purl.org/dc/dcmitype/StillImage	image/png	https://zenodo.org/record/16999541/files/figure.png	https://doi.org/10.5281/zenodo.16999541	Fig. 1 Nepenthes samar Jebb & Cheek.a. Habit, with climbing stem, upper pitcher (after rehydration), infructescence and transverse section of stem;b. lower surface of leaf with sessile glands and a pennate nerve; c. pedicel indumentum; d. tepal, lower surface; e. detail of d showing margin; f. lid, lower surface, up- per pitcher (nectar glands shown on left side only); g. spur; h. peristome near lid, viewed from above; i. peristome inner edge; j. peristome, transverse section (inner surface on right); k. dendritic hairs on outer pitcher below peristome; l. indumentum of outer pitcher surface with appressed simple hairs; m. detail of transversely elliptic nectar glands and sessile glands on lower surface of lid (Gaerlan & Chavez in PPI 26416). — Scale bars: a = 5 mm; b, d = 1 mm; c, e, j, k = 0.5 mm; f–i = 1 cm; l, m = 2 mm.	Fig. 1 Nepenthes samar Jebb & Cheek.a. Habit, with climbing stem, upper pitcher (after rehydration), infructescence and transverse section of stem;b. lower surface of leaf with sessile glands and a pennate nerve; c. pedicel indumentum; d. tepal, lower surface; e. detail of d showing margin; f. lid, lower surface, up- per pitcher (nectar glands shown on left side only); g. spur; h. peristome near lid, viewed from above; i. peristome inner edge; j. peristome, transverse section (inner surface on right); k. dendritic hairs on outer pitcher below peristome; l. indumentum of outer pitcher surface with appressed simple hairs; m. detail of transversely elliptic nectar glands and sessile glands on lower surface of lid (Gaerlan & Chavez in PPI 26416). — Scale bars: a = 5 mm; b, d = 1 mm; c, e, j, k = 0.5 mm; f–i = 1 cm; l, m = 2 mm.	2013-09-10	Cheek, M.;Jebb, M.		Zenodo	biologists	Cheek, M.;Jebb, M.			
